Tóm tắt (luận văn bằng tiếng Anh)
Lần đầu tiên, hệ màng mỏng đa lớp [MnPd/Co]10 đã được nghiên cứu. Kết quả cho thấy độ lớn trường trao đổi dịch và năng lượng dị hướng từ vuông góc lớn đã thu được ở dưới nhiệt độ blocking TB ~ 240 K. Sự phụ thuộc của hiện tượng trao đổi dịch vào chiều dày các lớp cũng đã được xem xét. Hướng của trục dễ phụ thuộc mạnh vào chiều dày của cả hai lớp Co và MnPd. Nguồn gốc của dị hướng từ vuông góc được gán cho hiệu ứng từ đàn hồi do sự hình thành của hợp kim CoPd ở mặt tiếp xúc giữa lớp Co và MnPd.
Để giải thích cơ chế của hiện tượng trao đổi dịch vuông góc, một mô hình hiện tượng luận đã được đề xuất trong đó sự thăng giáng của các spin lớp MnPd ở mặt tiếp xúc đóng một vai trò quan trọng. Ngoài ra, hệ màng đa lớp còn thể hiện hiệu ứng dị thường liên quan tới dị hướng cảm ứng từ trường, tức là, quá trình làm nguội trong từ trường song song với bề mặt màng làm tăng cường tính dị hướng vuông góc thay vì từ trường làm nguội vuông góc.
Preface 1
Chapter 1 Introduction
1.1 Background 3
1.2 Overview on exchange bias 6
1.3 Previous studies on perpendicular exchange bias 12
Chapter 2 Experimental
2.1 Introduction 15
2.2 Sample preparation 15
2.3 Experimental techniques 18
2.3.1 Glancing incident X-ray diffraction 18
2.3.2 Field emission scanning electron microscope 18
2.3.3 Stylus-method profilemetry 19
2.3.4 Energy dispersive X-ray spectrometer 19
2.3.5 Wavelength dispersive X-ray spectrometer 20
2.3.6 Magnetization hysteresis loops 21
2.3.7 Magnetization – temperature curve 22
2.3.8 Magnetic force microscope & atomic force microscope 22
Chapter 3 Experimental results
3.1 Introduction 23
3.2 Crystallographic structure 23
3.2.1 Glancing incident X-ray diffraction 23
3.2.2 Cross-section observation 25
3.3 Magnetic properties 25
3.3.1 Domain observation 26
3.3.2 Magnetization hysteresis loops at low temperature 26
3.3.3 Magnetization hysteresis loops at room temperature 30
3.3.4 Temperature dependence of magnetization in MnPd/Co
multilayers 36
Chapter 4 Discussions
4.1 Introduction 37
4.2 Crystallographic structure 37
4.2.1 Glancing incident X-ray diffraction 37
4.2.2 Cross-section observation 38
4.3 Magnetic properties 38
4.3.1 Domain observation 39
4.3.2 Thickness dependence of exchange bias 39
4.3.2.1 Co thickness dependence of exchange bias 39
4.3.2.2 MnPd thickness dependence of exchange bias 41
4.3.3 Perpendicular magnetic anisotropy in MnPd/Co
multilayers 43
4.3.3.1. Perpendicular anisotropy at low temperature 44
4.3.3.2. Perpendicular anisotropy at room temperature 46
4.3.3.3. Effect of annealing on perpendicular anisotropy 46
4.3.3.4. Anomalous field induced anisotropy 50
4.3.4 Temperature dependence of magnetization in MnPd/Co
multilayers 51
4.4 Explanation of exchange bias coupling mechanism 52
Conclusions and further direction 56
References 58
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rature curve were carried out by a VSM system
(described in the previous subsection). Temperature was controlled by
evaporating liquid nitrogen (in the range of low temperature) or blowing pure
nitrogen gas (in the range of high temperature), and simultaneously adjusting
the current for the heating coil. In the present study, the measurement was
performed in the temperature range from 120 to 320 K and the step of 5 K.
2.3.8 Magnetic force microscope & atomic force microscope
Observations of magnetic domains were carried out using a NT-MDT
Solver magnetic force microscope (MFM) at the College of Technology,
Vietnam National University, Hanoi. The tip used in the present study was
coated by CoCr alloy with the coating thickness of 40 nm, the curvature
radius of 30-40 nm and the cone angle less than 30 degrees. Before each
measurement, it was magnetized along the direction perpendicular to the
sample surface. The same tip was used to observe the MFM and AFM
images. The surface roughness was determined to be less than 2 nm.
- 23 -
Chapter 3
3. EXPERIMENTAL RESULTS
3.1 Introduction
In this chapter, the results of crystallographic and magnetic properties of
[MnPd/Co]10 multilayer thin films are presented. The crystallographic
properties characterized by XRD, FESEM and AFM. Meanwhile, the
magnetic properties, in particular parallel and perpendicular exchange biases
and anisotropy, are characterized by VSM and MFM.
The aim of the present thesis is to study the perpendicular exchange bias
effect. Therefore, the investigation and comparison between parallel and
perpendicular exchange biases is necessary. The perpendicular magnetic
anisotropy is also important due to its contribution to the effect. Some
measurements were carried out at room temperature for a better understanding
of physical origin of the perpendicular anisotropy and also perpendicular
exchange bias. The magnetic properties of the multilayers are discussed in the
next chapter in conjunction with the structure.
3.2 Crystallographic structure
3.2.1 Glancing incident X-ray diffraction
Fig. 3-1 shows the θ/2θ scan X-ray diffraction pattern of [MnPd(10
nm)/Co(x nm)]10 (x = 2.5, 3.5, 4.5 nm) as-deposited multilayers.
-24-
25 30 35 40 45 50 55 60 65 70
0
200
400
600
800
1000
1200
1400
(
2
2
0
)
(
2
0
0
)
(b)
(c)
(a)
(
1
1
1
)
Fig. 3-1. X-ray diffraction spectra of [MnPd(10 nm)/Co(x nm)]10 multilayers, (a) x = 2.5 nm, (b) x = 3.5 nm, (c) x = 4.5 nm.
2θ (deg.)
I
n
t
e
n
s
i
t
y
(
a
.
u
.
)
- 25 -
3.2.2 Cross-section observation
Shown in Fig. 3-2 is the cross-section image of [MnPd(10
nm)/Co(7.5nm)]10 as-deposited multilayer.
Fig. 3-2. Cross-sectional view of [MnPd(10 nm)/Co(7.5 nm)]10 as-
deposited multilayer.
3.3 Magnetic properties
The magnetic properties of the present sample were characterized by using
the VSM and MFM. Based on the VSM measurements with the field cooling
process, one can estimate the exchange bias field as well as the anisotropy
constants. The magnetic anisotropy was also investigated through the domain
structure observed by MFM for some typical samples at room temperature.
Some hysteresis loop measurements were carried out at room temperature in
order to understand the origin of the perpendicular magnetic anisotropy.
- 26 -
3.3.1 Domain observation
Observation of the domains by MFM at the sample surface of [MnPd(10
nm)/Co(3.5 nm)]10 as-deposited multilayer is shown in Fig. 3-3.
Fig. 3-3. MFM image of [MnPd(10 nm)/Co(3.5 nm)]10 as-deposited
multilayer.
3.3.2 Magnetization hysteresis loops at low temperature
Before the magnetization hysteresis loop measurements, the samples had
to undergo the so-called field cooling (FC) process.
First, MnPd/Co multilayer deposited onto Si(111) substrate was heated to
T = 590 K and kept at that condition for 5 minutes. Then the sample was
cooled down to room temperature in the presence of a magnetic field of 5 kOe
- 27 -
(called the cooling field HFC) applied either in the film plane (parallel
direction) or normal to the plane (perpendicular direction). This process was
realized in a vacuum chamber with the pressure better than 2 × 10-5 mbar.
After that, the sample cooled in a field of 5 kOe between the two poles of the
VSM from room temperature down to the measurement temperature. Finally,
the hysteresis loops were measured with the applied field direction as the
same as the cooling field at cryogenic temperature below the blocking
temperature TB ~ 240 K, namely at T = 120 K (see Fig. 3-4).
Samples with the different thicknesses of Co and MnPd layers were
studied. Parallel and perpendicular hysteresis loops measured at 120 K were
shown in Fig. 3-5 for the series of samples with tCo varied from 2.5 to 10 nm
while tMnPd is fixed at 10 nm and in Fig. 3-6 for another series of samples with
the variation of tMnPd from 3.5 to 30 nm while keeping tCo at 3.5 nm.
HFC
H
HFC
H
Fig. 3-4. Schematic diagram of measurement configurations for
samples at 120K. Here, the measurement field direction (H) is the
same as the cooling field (HFC).
- 28 -
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
tCo = 2.5 nm
M
(a
.u
.)
H (kOe)
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo =3.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular Parallel
M
(a
.u
.)
H (kOe)
tCo = 4.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 5.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 7.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 10 nm
Fig. 3-5. Parallel and perpendicular hysteresis loops measured at T = 120 K for
[MnPd(10 nm)/Co(x nm)]10 (x = 2.5, 3.5, 4.5, 5.5, 7.5, 10 nm) field cooled
multilayers.
- 29 -
Fig. 3-6. Parallel and perpendicular hysteresis loops measured at T =
120 K for [MnPd(y nm)/Co(3.5 nm)]10 (y = 3.5, 5.5, 7.5, 10, 15.5, 30
nm) field cooled multilayers.
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tMnPd = 3.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular Parallel
M
(a
.u
.)
H (kOe)
tMnPd = 5.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular Parallel
M
(a
.u
.)
H (kOe)
tMnPd = 7.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
tMnPd = 10 nm
H (kOe)
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular Parallel
M
(a
.u
.)
H (kOe)
tMnPd = 15.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tMnPd = 30 nm
- 30 -
3.3.3 Magnetization hysteresis loops at room temperature
Magnetization hysteresis loop measurements of the samples processed at
different conditions were carried out at room temperature (see Fig. 3-7).
MnPd/Co multilayer deposited onto Si(111) was heated to 590 K and kept
at that condition for 5 minutes. Then, the sample was cooled down to room
temperature in the presence of a magnetic field of 5 kOe applied either normal
to the plane (perpendicular direction) (Fig.3-7-(a)) or in the film plane
(parallel direction) (Fig. 3-7-(b)). These samples processed at the same
conditions as that described in the previous subsection. Some others were
annealed at 590 K for 5 minutes, and then cooled down to room temperature
in zero field (so-called zero field cooling ZFC) (Fig. 3-7-(c)). Besides, as-
deposited samples were also used for these measurements (Fig. 3-7-(d)) in
order to investigate systematically the effect of the field cooling and also
annealing process.
It should be noted that hysteresis loops of each sample were carried out in
both the parallel and perpendicular directions at room temperature. The
hysteresis loops of different samples processed at the same conditions are
depicted from Fig. 3-8 to Fig. 3-11.
- 31 -
d) Sample as-
deposited
H
H
c) Sample cooled in
the zero field
H
H
b) Sample cooled in
the parallel field.
H
HFC
H
a) Sample cooled in
the perpendicular
field.
HFC
H
H
Fig. 3-7. Schematic diagram of measurement configurations at room temperature.
Here, HFC denotes the cooling field direction and H denotes measurement field
directions. Note that all samples were measured in two different directions.
- 32 -
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 2.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 4.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 5.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 7.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 10 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 3.5 nm
Fig. 3-8. Parallel and perpendicular hysteresis loops measured at room
temperature for [MnPd(10 nm)/Co(x nm)]10 (x = 2.5, 3.5, 4.5, 5.5, 7.5, 10 nm)
multilayers cooled in the field perpendicular to the plane.
- 33 -
Fig. 3-9. Parallel and perpendicular hysteresis loops measured at room
temperature for [MnPd(10 nm)/Co(x nm)]10 (x = 2.5, 3.5, 4.5, 5.5, 7.5, 10 nm)
multilayers cooled in the field parallel to the plane.
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 2.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 3.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 4.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 5.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 7.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 10 nm
- 34 -
Fig. 3-10. Parallel and perpendicular hysteresis loops measured at room
temperature for [MnPd(10 nm)/Co(x nm)]10 (x = 2.5, 3.5, 4.5, 5.5, 7.5, 10 nm)
multilayers cooled in the zero field.
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 2.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 3.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0
Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 4.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 5.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 7.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 10 nm
- 35 -
Fig. 3-11. Parallel and perpendicular hysteresis loops measured at room
temperature for [MnPd(10 nm)/Co(x nm)]10 (x = 2.5, 3.5, 4.5, 5.5, 7.5, 10
nm) as-deposited multilayers.
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 2.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 4.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 5.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 3.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 7.5 nm
-15 -10 -5 0 5 10 15
-1.0
-0.5
0.0
0.5
1.0 Perpendicular
Parallel
M
(a
.u
.)
H (kOe)
tCo = 10 nm
- 36 -
3.3.4 Temperature dependence of magnetization in MnPd/Co multilayers
The multilayer of [MnPd(10 nm)/Co(3.5 nm)]10 was heated up to 590 K
and kept at that condition for 5 minutes. After that, the sample was cooled
down to room temperature in the zero field. This process was carried out in a
vacuum chamber with the pressure better than 2×10-5 mbar. The
magnetization – temperature curve of this multilayer was recorded by first
cooling the sample from room temperature to 120 K in the zero magnetic
field, then applying the magnetic field of 2500 Oe and warming the sample up
to 320 K in the presence of the field and recording the moment in this
warming cycle (Forward). Next, keeping the field while the sample is cooled
from 320 K down to 120 K and recording the moment (Backward). It is noted
that the applied field is perpendicular to the plane. The obtained curve is
shown in Fig. 3-12.
120 150 180 210 240 270 300 330
0
50
100
150
200
250
300
Forward
Backward
M
(e
m
u/
cm
3 )
T (K)
ZFC
H = 2500 Oe
Fig. 3-12. Magnetization – temperature curve of [MnPd(10
nm)/Co(3.5 nm)]10 multilayer in the presence of a field of 2500 Oe.
- 37 -
Chapter 4
4. DISCUSSIONS
4.1 Introduction
This chapter is to discuss the results of crystallographic and magnetic
properties of [MnPd/Co]10 multilayers presented in the previous chapter. The
behaviors of exchange bias in both the parallel and perpendicular directions
and magnetic anisotropy will be studied. After that, based on the results of
parallel and perpendicular exchange biases and the magnetic anisotropy, we
propose a phenomenological picture to qualitatively explain the perpendicular
exchange bias coupling mechanism.
4.2 Crystallographic structure
Crystallographic properties are obtained from XRD patterns and cross-
section observation using a FESEM. They are discussed here due to their
relation to the magnetic properties of the multilayers.
4.2.1 Glancing incident X-ray diffraction
Fig. 3-1 shows the θ/2θ scan X-ray diffraction patterns for as-deposited
[MnPd(10 nm)/Co(x nm)]10 (x = 2.5, 3.5, 4.5) multilayers grown onto Si(111)
substrates held at ambient temperature. It is observed that in the samples,
MnPd is polycrystalline with fcc structure. Apart from the peak (111), other
peaks of MnPd are also observed as (200) and (220) for the sample with the
smallest tCo (tCo = 2.5 nm). However, they are found to be very weak and
unobservable with increasing tCo. Meanwhile, almost no peak for Co can be
observed showing that Co layer may be formed with low crystallinity.
- 38 -
4.2.2 Cross-section observation
Shown in Fig. 3-2 is cross-sectional view observed by FESEM microscope
on the fresh broken pieces of the as-deposited [MnPd(10 nm)/Co(3.5nm)]10
multilayer thin film. One can see that there are 20 layers corresponding to
alternate MnPd and Co through the dark and bright contrast (as shown in Fig.
2-2). From the bottom to top, cumulative waviness increases gradually. The
effect is usually observed in multilayer thin films, especially in metallic ones
[63].
4.3 Magnetic properties
The magnetic properties are discussed based on the magnetic
measurements. From the hysteresis loops, one can estimate the exchange bias
field as well as the anisotropy constants. Besides, the anisotropy property can
be also qualitatively estimated through domain structure observed by MFM.
As shown in Fig. 3-5 and Fig. 3-6, the negative shifts of the hysteresis
loops show that the exchange bias effect is found in the [MnPd/Co]10
multilayers in both the parallel and perpendicular directions.
From the hysteresis loops, the exchange bias field (HE) and the coercivity
(HC) can be extracted by using definitions:
HE = |HSU + HSD|/2 (Eq. 4-1)
HC = (HSU - HSD)/2 (Eq. 4-2)
Where, HSU and HSD are the switching fields in the upward and downward
branches, respectively, of the hysteresis loop.
Besides, the effective magnetic anisotropy (Keff) can also be readily
deduced from the hysteresis loops. Hence, the uniaxial magnetic anisotropy
(KU) is quantitatively calculated as shown later.
The largest exchange bias fields are found to be extremely high, 1750 and
1650 Oe in the parallel and perpendicular cases, respectively.
- 39 -
It is interesting to note that the preferred orientation of the magnetization
perpendicular to the plane is observed. The result also means that the uniaxial
magnetic anisotropy is present in the samples. Its value is expected to be large
due to taking into account the demagnetization field anisotropy for the case of
perpendicular applied magnetic field.
4.3.1 Domain observation
As shown in Fig. 3-3, domain structure observed by MFM at the samples
surface is clearly seen. This domain structure again confirms the
perpendicular magnetic anisotropy existing in the studied multilayers. We
note that the domain size is in order of several hundreds of nanometers.
4.3.2 Thickness dependence of exchange bias
Effects of the MnPd and Co thicknesses on perpendicular and parallel
exchange biases will be more quantitatively analyzed in the next subsections
in order to have an insight into the phenomena.
4.3.2.1 Co thickness dependence of exchange bias
Shown in Fig. 4-1 are the variations of the parallel and perpendicular
exchange bias fields HE as a function of the Co thickness derived from the
experimental curves in Fig. 3-5. We also present unidirectional anisotropy
constant (JK) versus the Co thickness, which is defined as:
2
SCoE
K
MtHJ ××= (Eq. 4-3)
- 40 -
2 3 4 5 6 7 8 9 1 0 1 1
0
1 0 0 0
2 0 0 0
3 0 0 0
4 0 0 0 P e rp e n d ic u la r
P a ra lle l
T = 1 2 0 K
H
C
(O
e)
tC o (n m )
2 3 4 5 6 7 8 9 1 0 1 1
0
5 0 0
1 0 0 0
1 5 0 0
2 0 0 0
P e rp e n d ic u la r
P a ra lle l
T = 1 2 0 K
H
E (
O
e)
tC o (n m )
2 3 4 5 6 7 8 9 1 0 1 1
0 .0 0
0 .0 5
0 .1 0
0 .1 5
0 .2 0
P e rp e n d ic u la r
P a ra lle l
T = 1 2 0 K
J K
(e
rg
/c
m
2 )
tC o (n m )
Fig. 4-1. The Co thickness dependence of perpendicular and parallel exchange bias
fields (HE) , unidirectional anisotropy constant (JK) and coercitivity (HC).
- 41 -
Where HE is the exchange bias field, tCo is the Co thickness and MS is the
saturation magnetization of Co layer which is in order of 320 (emu/cm3) in
these measurements. A factor ½ in Eq. 4-3 is due to the fact that one layer has
two interfaces. In this series of samples, tMnPd is fixed at 10 nm while tCo is
varied from 2.5 to 10 nm. The maximum values of the parallel and
perpendicular exchange bias fields in this series are very large (950 and 1650
Oe, respectively).
As for the interfacial exchange energy, JK in the perpendicular cases is
higher than that in the parallel ones. The maximum values are respectively
0.15 and 0.17 erg/cm2 for parallel and perpendicular exchange biases obtained
at the highest tCo in the present study and there is no sign of leveling off. It
seems, however, that the interfacial exchange energy in the parallel direction
will cross over that in the perpendicular one as tCo passes a certain value
larger than 10 nm.
4.3.2.2 MnPd thickness dependence of exchange bias
Fig. 4-2 illustrates the variations of the parallel and perpendicular
exchange fields with varying tMnPd as derived from the experimental curves in
Fig. 3-6. In this series of samples, tCo is fixed at 3.5 nm while tMnPd is varied
from 3.5 to 30 nm. The perpendicular exchange bias field increases as
increasing tMnPd from 3.5 to 7.5 nm, and it decreases gradually with tMnPd value
larger than 7.5 nm. Meanwhile, in the parallel cases, the situation is in the
opposite, i.e., HE decreases as varying tMnPd from 3.5 to 7.5 nm and increases
with tMnPd larger than 7.5 nm. At the same tMnPd value of 7.5 nm, the
perpendicular exchange bias field reaches to a maximum value up to 1650 Oe
while the parallel exchange bias field has a minimum value down to 250 Oe.
The maximum HE in the parallel direction is up to 1750 Oe at the smallest
tMnPd in the present study.
- 42 -
0 5 10 15 20 25 30
0
500
1000
1500
2000
P e rp e n d ic u la r
P a ra lle l
H
E (
O
e)
tM nP d (n m )
0 5 10 15 20 25 30
0
1000
2000
3000
4000
5000
6000
P e rp e n d ic u la r
P a ra lle l
H
C
(O
e)
tM nP d (n m )
Fig. 4-2. The MnPd thickness dependence of perpendicular and parallel
exchange bias fields (HE), coercitivity (HC).
It is very interesting to note that by the optimum choice of the thicknesses
of Co and MnPd layers in these two systems, we have obtained samples with
“pure” perpendicular exchange bias effect, meaning that the parallel exchange
bias field is much less than the perpendicular one. This property is rather
- 43 -
unique comparing with another work in [FeMn/FePt]10 multilayers in which
both perpendicular and parallel exchange biases are always coexistent (see
Phuoc et al. [59]).
4.3.3 Perpendicular magnetic anisotropy in MnPd/Co multilayers
The present section focuses on the perpendicular magnetic anisotropy
found in MnPd/Co multilayers. From the hysteresis loops, the effective
magnetic anisotropy can be readily obtained from the area enclosed between
the parallel and perpendicular magnetization curves [64]. It is well established
that the effective magnetic anisotropy could be phenomenologically separated
into a volume contribution KV and a contribution from the interfaces KS, and
approximately described by:
Co
S
Veff t
KKK 2+= (Eq. 4-4)
This relation just represents a weighted average of the magnetic anisotropy
energy of the interface atoms and the inner atoms of a ferromagnetic layer of
thickness tCo. The factor of 2 implies that one ferromagnetic layer is assuming
to be bounded by the two identical interfaces. Eq. 4-4 is commonly used in
experiment studies to determine the magnitudes of KV and KS by plotting the
product of KefftCo versus tCo as in Fig. 4-3-(a). It should be noted that Eq. 4-4
could be rewritten as:
SCoVCoeff KtKtK 2+= (Eq. 4-5)
Combining Eq. 4-5 with the linear fit of the plot of KefftCo versus tCo, one
can readily deduce that the slope of the fit line gives KV and the vertical axis
intercept equal 2KS. Below a certain thickness (-2KV/KS), the interface
anisotropy contribution outweighs the volume contribution, resulting in a
perpendicularly magnetized system.
- 44 -
A negative Keff describes the case of a preferred orientation of the
magnetization parallel to the plane. Inversely, a preferred orientation of the
magnetization is perpendicular to the plane if Keff is positive. The negative
slope indicates that a negative volume anisotropy KV, favoring parallel
magnetization, while the intercept at zero Co thickness indicates a positive
interface anisotropy, KS, favoring perpendicular magnetization.
4.3.3.1 Perpendicular anisotropy at low temperature
As mentioned before, in Fig. 3-5 and Fig. 3-6, the perpendicular
anisotropy was clearly evidenced. In the series of samples with varying tCo,
the perpendicular easy axis transforms into the parallel one as tCo passed a
critical value of 9 nm (see Fig. 4-3-(a)). Inversely, the easy axis switches from
the parallel to the perpendicular direction for the series of samples with
increasing tMnPd from 3.5 to 30 nm (see Fig. 3-6). It is remarkable that the spin
reorientation in these multilayers is observed for the first time in our
experiments.
From the fit line shown in Fig. 4-3-(a), the value of |KV| is in the order of
106 (erg/cm3) and KS is about 0.6 (erg/cm2).
Quantitative analysis on the perpendicular anisotropy of the thin films or
multilayers can be based on the so-called uniaxial magnetic anisotropy (KU).
This quantity can be calculated from Keff and MS by using definition: [64]
KU = Keff + 2πMs2 (Eq. 4-6)
The obtained result is shown in Fig. 4-3-(b). We note that the uniaxial
magnetic anisotropy energy in the present samples is found to be large (in
order of 106 (erg/cm3)) and slowly reduces with increasing tCo.
It should be noted that the saturation magnetization of Co layers in the
present study is of about 320 (emu/cm3) which is much smaller than the bulk
Co value of about 1400 (emu/cm3) leading to the reduced |KV| for which the
- 45 -
major contribution is from the demagnetizing field energy. However, it is
interesting that the low saturation magnetization of Co layers results in a
reduced shape anisotropy, which is usually the main opponent of
perpendicular magnetic anisotropy.
It is mentioned that we have ignored the effect of the cooling field in
calculating the anisotropy energies. However, to some extent, they are still
invaluable and may be used to estimate the perpendicular anisotropy energy.
0 1 2 3 4 5 6 7 8 9 10 11
-0.5
0.0
0.5
1.0
1.5
Linear fit
K
ef
f×
t C
o (
er
g/
cm
2 )
tCo (nm)
2KS
KV
(a)
T=120 K
2 3 4 5 6 7 8 9 10 11
0
1
2
3
4
K
U
(1
06
e
rg
/c
m
3 )
tCo(nm)
(b)
T=120 K
Fig. 4-3. (a) The plot of the product of Keff and tCo versus tCo and (b) the
plot of KU versus tCo of [MnPd(10 nm)/Co(x nm)]10 (x =2.5, 3.5, 4.5, 5.5,
7.5, 10 nm) multilayers at 120K.
- 46 -
4.3.3.2 Perpendicular anisotropy at room temperature
The preferred orientation of the magnetization perpendicular to the plane
is not observed in the as-deposited samples (see Fig. 3-8). For the samples
with small tCo, there is not the preferred orientation of the magnetization.
Meanwhile, the orientation of the magnetization parallel to the plane is
preferred at large tCo. However, this property is improved considerably by
annealing and the field cooling which will be discussed in details in the next
subsections.
Fig. 4-4-(a) shows a deviation from the linear behavior at small tCo. This
effect is often present in the anisotropy studies of transition metal multilayers
[64]. Many explanations have been given in this case. However, it is noted
that this behavior was absent at low temperature. Therefore, a lowering of
Curie temperature with the magnetic layer thickness, which is a well-known
finite-size effect, can play an important role in the case of room temperature
measurements [64].
As shown in Fig. 4-4-(b), KU is enhanced considerably by annealing and
the field cooling. In some cases, the enhancement of KU makes its value
overcome the demagnetization energy, therefore the preferred orientation of
the magnetization switches from the in-plane to the perpendicular direction.
The highest difference in KU (post and pre – processing) is observed up to 106
(erg/cm3) for the samples with tCo = 7.5 nm.
4.3.3.3 Effect of annealing on perpendicular anisotropy
As shown in Fig. 4-4, the annealing process enhances the perpendicular
orientation of the magnetization in comparison with the as-deposited samples
- 47 -
indicating that this process has influenced the crystal structure of the
multilayers which is directly related to magnetic properties.
2 3 4 5 6 7 8 9 10 11
-1.5
-1.0
-0.5
0.0
0.5
1.0
Perpendicular FC
Parallel FC
ZFC
As-deposited
K
ef
ft C
o (
er
g/
cm
2 )
tCo (nm)
(a)
2 3 4 5 6 7 8 9 10 11
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
Perpendicular FC
Parallel FC
ZFC
As-deposited
K
U
(1
06
e
rg
/c
m
3 )
tCo (nm)
(b)
Fig. 4-4. Anisotropy energies of [MnPd/Co]10 multilayers which were
treated at different conditions. (a) Plot of the product of Keff and tCo
versus tCo and (b) plot of KU versus tCo at room temperature.
- 48 -
Many previously reported investigations have shown the origins of the
perpendicular anisotropy in [Pd/Co] multilayers. The main contribution to the
anisotropy is ascribed to the lattice mismatch between the layer Co and Pd
[65, 66] and/or lowered symmetric property at the interface (Néel’s model)
[67]. However, these phenomena often happen in the systems with the Co
thickness of about few angstroms which is not in the case of our experiments
where the Co thickness is order of nanometers. Another source of
perpendicular anisotropy might come from c-axis preferred orientation of hcp
Co. This assumption is also ruled out in our multilayers since XRD patterns
show almost no peaks for Co.
Since the composition analysis shows that the Pd composition in the AF
layers up to 89 at. %, it is likely that interdiffusion between the MnPd and Co
layers can give rise to the formation of interfacial alloys of Co-Pd. Therefore,
we propose a schematic diagram of our multilayer structure as shown in Fig.
4-5. The CoPd alloy is known to have a large magnetostriction and large
magnetic anisotropy [68]. Since the perpendicular anisotropy exists only as
Co layer kept between two mono-layers, these interfacial alloys can
experience significant tress due to lattice mismatch with MnPd layer. Thus, a
strained interfacial alloy can be the origin of the perpendicular anisotropy in
the multilayers. This suggestion is also consistent with the previous studies in
Co/Pd [69, 70] and CoPd/Pd [71] multilayers.
The interdiffusion is present even at room temperature [69], thus KU in
the as-deposited sample may partly come from the strained interfacial alloy.
The annealing process is understood as the enhancement of the interdiffusion
and crystalline quality.
It is worth noting that the preferred orientation of the magnetization of
the as-deposited multilayer of [MnPd(10 nm)/Co(7.5 nm)]10 switched from
- 49 -
the in-plane to the perpendicular direction as the sample had been annealed at
590 K for 5 minutes in vacuum and then cooled down to room temperature
whether or not magnetic field was applied (see Fig. 4-4-(a)).
From the assumption above, the Co and MnPd thicknesses (tCo and tMnPd,
respectively) are understood as nominal values. Simultaneously, the deviation
from the linear behavior shown in Fig. 4-4-(a) also originates from the local
composition variations of CoPd interfacial alloys which have TC depending on
their composition. Unfortunately, it is very difficult to determine these
compositions.
Si substrate
CoPd
CoPd
MnPd
Co
CoPd
MnPd
Co
Fig. 4-5. Schematic diagram of multilayer structure after annealing.
- 50 -
4.3.3.4 Anomalous field induced anisotropy
Studies on field-induced anisotropy in magnetic materials are not of
particular interest in recent years. Naturally, one may expect that the cooling-
field forces the easy axis direction parallel to the applied field. However, it is
not in agreement with the present study.
Anomalous field induced anisotropy at room temperature was observed
for the first time in [MnPd/Co]10 multilayers. The uniaxial magnetic
anisotropy was enhanced as the sample field cooled in the parallel magnetic
field instead of that in the perpendicular one as usual. Meanwhile, the uniaxial
anisotropy in the samples cooled in the perpendicular field is not improved
comparing with that after annealing and zero-field cooling (see Fig. 4-4-(b)).
The result shows that the field cooling direction has strongly influenced on
the anisotropy property of the multilayers.
We try to explain this anomalous phenomenon by estimating the effect of
the field cooling on each layer of the sample. The MnPd and Co layers are
eliminable because MnPd is paramagnetic at room temperature and Co is less
crystalline. Since CoPd alloys have extremely large negative magnetostriction
constants (λS = -1.5 × 10-4) [70], the parallel field can give rise to in-plane
additional tensile stress compared with the zero field due to the enhancement
of the misfit between CoPd interfacial alloy and MnPd layer. Meanwhile, the
perpendicular field may not lead to the strong enhancement of this misfit
because the strain of CoPd caused by the out-of-plane field is mainly in the
normal direction.
For the sample with largest tCo, which the parallel orientation of the
magnetization after annealing is preferred, the anomalous effect is absent. In
this case, the CoPd alloy layer might become stable. It is likely due to the fact
- 51 -
that the demagnetization field energy in the FM layer is higher than the
uniaxial anisotropy. And therefore, it could give rise to the decline of the
uniaxial anisotropy energy.
From the analysis above, it can be seen that the anisotropy constants at
low temperature are not completely exact due to the strong effect of the field
cooling (see 4.3.3.1). The nature of the anomalous field induced anisotropy is
stress induced anisotropy.
4.3.4 Temperature dependence of magnetization in MnPd/Co multilayers
As shown in Fig. 3-12, three features are noticeable: (i) the ZFC curve
exhibits a peak at 180 K; (ii) the forward and downward parts considerably
depart from each other below this peak temperature and (iii) the reduction of
the magnetization with increasing temperature. It is should be noted that the
reduction of the magnetization is absent for the samples with large tCo.
Besides, the magnetization contribution of CoPd interfacial alloy is
considerable due to the polarization of Pd [69].
Appearance of a peak in the ZFC curve owes to blocking mechanism
arising from a competition between the thermal energy and the magnetic
anisotropy energy.
Departure of the backward from the forward parts is suggestive of
temporal relaxation, i.e., evolution of magnetization with time.
The magnetization of the sample measured at small field perpendicular to
the film plane decreases with increasing temperature. In the samples with
small tCo, the reduction of the magnetization is found clearly, however it is not
considerable in the samples with large tCo. Therefore, first of all, it is due to
the reduction of the Curie temperature in Co thin films. Besides, the reduction
of the magnetization partly comes from the CoPd interfacial alloys which
- 52 -
have local composition variations and the Curie temperature ranging from
1404 K for pure Co down to 130 K for a 3 at.% Co alloy [72].
4.4 Explanation of exchange bias coupling mechanism
Based on the studies on exchange bias and perpendicular anisotropy, we
try to give a model to describe qualitatively the observed behaviors.
The analysis of the origin of the perpendicular anisotropy in the previous
section shows that it is due to the stressed alloying at the interface MnPd/Co.
As experimentally observed in Fig. 3-5 and Fig. 3-6, the resultant easy axis is
perpendicular to the plane in most of the samples, except some samples which
parallel easy axis is favorable. Thus, there are two configurations of the FM
spins corresponding to two preferred orientations of the magnetization.
¾ For the perpendicular-to-the-plane easy axis, the spins inside the FM
layers and also the spins of FM layers at the interfaces are normal to the film
plane.
¾ For the parallel-to-the-plane easy axis, the spins inside the FM layers
lie in the plane of the film meanwhile the spins of the FM layers at the
interfaces are canted with respect to the film plane. Because in this case, the
demagnetization field energy is higher than the uniaxial magnetic anisotropy
energy.
As for exchange bias coupling, in the present study, the coupling
between the FM layers and the AF layers is bilinear then the exchange bias
fields will be proportional to the projection of the MnPd spins to the field
cooling direction. Thus out-of-plane MnPd spin components are necessary to
obtain perpendicular exchange bias, while in-plane MnPd spin components
are necessary to obtain parallel exchange bias. Accordingly an out-of-plane
loop shift would vanish, if the MnPd spins would completely lie in the plane.
- 53 -
Since the multilayers have not sharp interfaces due to the interdiffusion
between the Co and MnPd layers, a phenomenological picture shown in Fig.
4-6 is reasonable. The fluctuations of the MnPd spins at the interfaces were
attributed to the origin of the exchange bias effect. These fluctuations may
originate from structural defects, roughness or exchange interaction to the FM
layer at the interface.
Regarding the MnPd thickness dependence of exchange bias, this behavior
may be related to the thickness dependence of magnetic structure of MnPd
layers at the interface. Obviously, there is the “conversion” of the exchange
bias coupling energy between the perpendicular and parallel cases. It gives
rise to the fact that the out-of-plane and in-plane AF spin components at the
interface change as varying the MnPd thickness. At small tMnPd, the preferred
orientation of the magnetization is in the film plane due to the fact that the
strain between CoPd interfacial alloy and MnPd layer is negligible. It partly
gives rise to the minority of the out-of-plane spin components. Therefore, the
exchange bias field in the parallel case is stronger than the perpendicular one.
Whereas, at larger tMnPd, the anisotropy property changes from the in-plane to
the perpendicular direction, the majority of the out-of-plane components
makes the perpendicular exchange bias predominate. However, after that, the
exchange bias field in the parallel direction increases slowly and overcomes
that in the perpendicular one which decreases gradually with increasing tMnPd.
This behavior may be attributed to the AF spin reorientation at the interface
which originates from a decrease of structural defects or rearrangement of the
MnPd structure. Unfortunately, the experimental confirmation of this situation
has not been carried out.
Using this phenomenological picture, we try to explain the Co thickness
dependence of exchange bias as keeping the MnPd thickness constant. At
- 54 -
a)
FM
AF
FM
AF
b)
Fig. 4-6. Schematic view of spin configurations of MnPd/Co
multilayer: (a) perpendicular-to-the-plane easy axis and (b) parallel-
to-the-plane easy axis.
small tCo, the parallel and perpendicular exchange bias coupling energies (JK)
increase with increasing tCo. It is likely related to the magnetic structure of the
FM layer at the interface with the formation of the CoPd alloy. Unfortunately,
- 55 -
the composition and magnetic structure of the alloy can not be controlled
because of the random intermixing. On the other hand, since the spins in the
FM layers perpendicular to the film plane (see Fig. 4-6-(a)), they induce the
spins arrangement in MnPd layers. The out-of-plane spin components in
MnPd layers are larger than the in-plane one. Therefore, the exchange bias
energy in the perpendicular direction is higher than that in the parallel one.
However, with increasing tCo, the easy axis of the magnetization rotated from
the perpendicular to the in-plane. The spin configuration in the FM layers
changes as shown in Fig. 4-6-(b). Thus, the spin arrangement in MnPd layers
also changes. The out-of-plane spin components reduce and the in-plane spin
components increase gradually. Hence, the interfacial exchange bias coupling
energy in the parallel direction will cross over that in the perpendicular one as
tCo passes a certain value larger than 10 nm.
From this phenomenological picture and the analysis above, we can
explain why in the previously reported studies [60, 61, 62] and unpublished
works by the Spintronics group (ITIMS), parallel exchange bias in MnPd/Co
bilayers is large meanwhile perpendicular exchange bias is smaller. It is
simple due to the restricted formation of CoPd interfacial alloy at the interface
between the MnPd and Co layers. This could give rise to the spin canting at
small angle to the film plane in Co layer at the interface. Thus, the out-of-
plane spin components of MnPd layer at the interface are much less than the
in-plane ones.
- 56 -
CONCLUSIONS AND FURTHER DIRECTION
In the present work, the results on the exchange bias effect in
Si/[MnPd/Co]10 multilayers are reported for the first time.
¾ Multilayers of Si/[MnPd/Co]10 were prepared successfully using the RF
sputtering system. Structural characterization by XRD shows that MnPd
layers are polycrystalline with fcc phase and Co layers may be less
crystalline.
¾ The exchange bias effect was found in both the parallel and perpendicular
directions. At T = 120 K, the largest exchange bias fields were extremely
high, up to 1750 and 1650 in the parallel and perpendicular cases,
respectively. The maximum value of JK is observed to be of 0.15 (erg/cm3) for
parallel exchange bias and 0.17 (erg/cm3) for perpendicular exchange bias.
Especially, we have obtained samples with nearly “pure” perpendicular
exchange bias effect, meaning that the parallel exchange bias field is much
less than the perpendicular one.
¾ Perpendicular magnetic anisotropy was also found in these samples. The
easy axis direction strongly depends on both the MnPd and Co thicknesses.
¾ The origin of the perpendicular magnetic anisotropy was attributed to the
formation CoPd interfacial alloy which causes a significant magneto-elastic
effect.
¾ A phenomenological picture was proposed to explain the exchange bias
effect. Fluctuations of the MnPd spins at the interface are presumed to be the
key point in the perpendicular exchange bias mechanism.
¾ The studied results also show the anomalous effect related to field-induced
anisotropy. The field cooling in the parallel direction enhanced the
perpendicular anisotropy property instead of that in the perpendicular one.
- 57 -
¾ In return, the strong perpendicular anisotropy plays a vital role in the
behavior of parallel and perpendicular exchange biases, and vice versa,
suggesting that one must take caution of the interplay between perpendicular
magnetic anisotropy and exchange bias when studying perpendicular
exchange biased systems. The study also gives a certain technological
advance for applications of multilayer thin films since we can simultaneously
control both strong perpendicular exchange bias and strong perpendicular
magnetic anisotropy.
More investigations are needed for a better understanding of the
perpendicular exchange bias effect such as: determining the blocking
temperature in both the parallel and perpendicular cases, investigating
influence of the anomalous field cooling effect on exchange bias and also the
origin of the perpendicular exchange bias effect and anisotropy in the
interplay between them...
- 58 -
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